New scanning probe microscopy techniques for analyzing organic photovoltaic materials and devices

July 28, 2010

Rajiv GiridharagopaL, Guozheng Shao, David S. Ginger, University of Washington; and Chris Groves, Durham University,discuss the experimental challenges and opportunities associated with two different AFM-based optoelectronic scanning probe techniques, photoconductive AFM (pcAFM) and time-resolved electrostatic force microscopy (trEFM), that have been used help understand how morphology impacts organic photovoltaic (OPV) performance.

Reprinted from Renewable Energy World